Optimizing processes with wafer/FOUP traceability

Tracking FOUPs in semiconductor manufacturing is important for contamination control, process optimization, yield improvement, quality control and compliance. It ensures the protection of wafers, optimizes workflow, enhances yield and maintains quality.

Challenge

Keeping up with traceability requirements

Efficiently tracking FOUPs in semiconductor manufacturing can be challenging due to the complexity of managing numerous FOUPs, handling large amounts of data, integrating with existing systems, ensuring automation accuracy, dealing with environmental factors, and complying with industry standards. Overcoming these challenges requires advanced tracking technologies, streamlined data management processes, seamless system integration, reliable automation solutions, environmental control measures, regular maintenance, and calibration procedures.

  • Managing the complexity of numerous FOUPs types
  • Integrating with existing systems
  • Complying with industry standards

Solution

Meeting industry standards  

Omron's RFID technology offers specialized features for semiconductor applications, including chemical resistance, compatibility with standardized glass transponders from Texas Instruments (reading and writing), and support for SECS I/II protocol. In addition to supporting SECS/GEM, it also supports five different SEMI standards. This technology tailored for SEMI will help fabs create consistency in the way FOUPs and pods are handled.

  • Compatibility with TI transponders
  • Support for SECS/GEM protocols
  • Resistance to chemicals

Enabling Technologies

Related Solutions

Semiconductor Industry Solutions >

See the solutions Omron offers to help your firm’s semiconductor manufacturing operations to the next level and improve time-to-market.

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See how Omron helps create the supply chain transparency that is essential for semiconductor fabs to ensure quality throughout the entire manufacturing process.

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