Benefits of the E3AS-HL Series

The E3AS-HL sensors ensure consistent detection, enhance flexibility, and minimize maintenance needs. All sensor variations have background suppression and detection window setting capabilities that can help with precise part positioning.

Stable detection amid target variation

The E3AS-HL Series uses a CMOS image array to achieve reliable detection levels even when the target is small, uneven or has differences in reflectivity.

Support for flexible production

Foreground and background suppression enhance the ability of the CMOS image array to selectively differentiate targets to aid in part positioning.

Ease of use and maintenance

The single teach button and a bright OLED display improve ease of use with set value and teach point confirmations, while IO-Link enables real-time condition monitoring and remote configuration.aximiz...

How the E3AS-HL sensors keep detection stable as objects vary

Stable detection can be challenging on flexible manufacturing lines. Here's how Omron technology makes it work.

  1. Stable detection of uneven objects. With conventional CMOS spot beam sensors, the end-user may experience unstable detection due to the uneven surface characteristics.. E3AS-HL Series line beam sensors mitigate surface issues like unevenness by “averaging” variable contours of the surface to achieve stable detection.
  2. Reliable detection of small targets. Detecting small objects like screw heads, positioning pins, nuts, rivets or even holes is a challenge for traditional diffuse sensors because detection angle and beam size change dramatically at longer distances. The E3AS-HL series uses a small spot beam (~2.5mm wide) to reliably detect small objects out to 500mm.

Simple teach mechanism and IO-link make setup easier than ever

The E3AS-HL series features the same single teach button of the E3AS-F and adds an OLED display to make status information readily accessible at all times. Teaching can also be done remotely via IO-Link. The sensors enable a variety of teaching options, including the following:

  • Background teaching
  • Two-point object teaching
  • Detection window setting
  • High-sensitivity reference teaching

All teach options can be implemented via IO-Link and can be done with measurement data that can be retrieved or input into the device.